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Mitutoyo > Resource Center > History-of-the-Micrometer

History-of-the-Micrometer

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News

September 23, 2021

We hereby announce a firmware defect on some QM-Height high performance height gages which are manufactured by Mitutoyo Corporation. As a measure to resolve the defect, Mitutoyo America Corporation is offering to update the firmware of affected QM-Height units at...

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January 11, 2022

Seminar #114: Dimensional Gage Calibration / Aurora, IL / Mitutoyo M3 Center

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Coordinate Measuring Machines

Form Measurement

Linear Encoders and DRO Systems

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Custom Solutions

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Custom Products
TAGLENS - Ultra-deep-focus
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Resources

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Literature

Metrology Books

Presentations

Videos

Webinars

White Papers

View all Resources
Education

M³ Solution Centers

Mitutoyo Institute of Metrology

Small Tools Knowledgebase

Capital Equipment Knowledgebase
Our Resource Center is your dedicated source for metrology literature, case studies, webinars and videos.
About Us
Accreditation

Careers

History

Leadership

News & Events

Philanthropy

Strategic Partner Associations

Worldwide Locations
Complimentary Virtual Metrology Software Programs
Contact Us
Distributor Locator

Register a Product

Request a Demo

Request a Quote

Request Service

M³ Solution Centers
Complimentary Virtual Metrology Software Programs

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