Category Archives: Videos

Check Points for Measuring Instruments – Digimatic Holtests

Check Points for Measuring Instruments – This video covers the proper use of Digimatic Holtests from Mitutoyo.

For more information on Mitutoyo products please visit

Check Points for Measuring Instruments brochure –…

Digimatic Holtests – Series 468 Three-Point Internal Micrometers –

Mitutoyo i-Checker

The i-Checker is specially designed to calibrate measuring accuracy of dial indicators, dial test indicators, and other electronic comparison gage heads with a stroke of up to 100mm (4″).

• ±(0.2+L/100)µm indication accuracy.
• Directly inspects an indicator with a stroke of up to 100mm (4″). The dial test indicator, bore gage and lever-type inductive head can be inspected with optional accessories.
• Adjustment of the measurement position is very easily accomplished because of semi-automatic measurement and full automatic measurement functions.
• Creates and prints out the simple inspection certificate.
• Saves inspection result as CSV file for reusable inspection result by any kind of software.

Mitutoyo Tracking Auto Focus

Mitutoyo’s new TAF equipped Quick Vision Systems include the following benefits;

  • Increases the throughput by eliminating the need to stop the stage motion to perform an autofocus
  • Continuous tracking of warped surfaces and stepped workpieces
  • Combine Mitutoyo’s Stroboscopic Illumination (QV Stream Systems) and TAF to enable non-stop dimensional measurement with industries highest measurement throughput
  • High performance, high resolution Tracking and Repeatability
  • TAF design allows point measurement by laser auto focus method
  • No need to add focus tools in the part programs as TAF is embedded in the measurement routine
  • Reduces the need to modify part programs for part to part variation Z axis inconsistencies as TAF adjusts to the target surface automatically
  • Available on all Mitutoyo QV Apex vision systems and the full range of our exclusive objective lenses

QM-Height Series ABSOLUTE Digital Height Gage

We are pleased to announce the New QM-Height Series ABSOLUTE Digital Height Gage with a best-in-class accuracy of 4.5µm. This high-performance height gage offers significant improvements in design and capability to the previous generation QM-Height and exceptional value to our customers. Features include:

  • New generation high accuracy / high resolution ABSOLUTE linear encoder for position detection
  • New higher accuracy – ±(2.4 + 2.1L / 600)μm
  • New pneumatic flotation system / positioning grip – allows for smooth movement along surface plate (select models)
  • New large, stationary display panel with user friendly icon control keys and GO/NG LED indicator
  • Digital and USB Output (New) – Supports Mitutoyo wireless SPC Output
  • Long battery life with standard AA batteries (4) – Up to 300 hours (80 hours with regular use of pneumatic flotation function)
  • Fully compatible with existing Mitutoyo Digimatic peripherals (SPC Cables, U-Wave wireless transmitters, multiplexers…etc)
  • QM-Height Package includes AC adapter


The New QM-Height measures height, as well as step, inside/outside widths, inside/outside diameters and circle pitch (height components), and also measures free-form surface maximum/minimum heights and displacement by scanning measurement. It remembers the preceding measurement (height component) and can display the difference (pitch) between results below the measurement.


Mitutoyo CRYSTA Apex EX with PH20


  • TheCRYSTA-ApexEX500T/700T/900TseriesareCNCCMMsequippedwith the 5-axis control PH20 touch-trigger probe.
  • 5-axis operation reduces the time required for probe rotational movements and allows more flexible positioning. This also ensures easy access to complex workpieces and saves time both during programming and measurement.
  • In addition to 3-axis point measurement similar to conventional coordinate measuring machines, the PH20 probe head also supports ‘head touch’ operation for quick point measurement using the two rotational axes of the probe only, with no movement required along the CMM axes.
  • The PH20 incorporates a TP20 probe and allows the use of modules designed for the TP20. Automatic probe changeover with the TCR20 module changer is also supported.

Mitutoyo America Corporate Video

Mitutoyo America Corporation is a sales, marketing, and most importantly a service organization that was established in the United States by Mitutoyo Corporation in 1963. Since day one of operations, supporting customers has been the first priority. Initially we provided replacement parts and repair services. As our customer base grew, so did customer service demands. In response we built one of the highest performance A2LA Accredited Calibration Laboratory’s (A2LA Certificate #750-01) in the nation. Now we offer turnkey metrology solutions and even integrate measuring directly into manufacturing processes via inline automation. Mitutoyo America is also the first service organization to have A2LA Accredited Field Service Technicians. State-of-the-art M3 Solution Centers are geographically positioned to cover the United States. Local software design and development translates into well resourced software support. We also provide education and training through the Mitutoyo Institute of Metrology. Overall, Mitutoyo America Corporation is configured to provide our customers with all the competitive advantages that result from application of best practice metrology.


IMTS 2014 – DMSC Demonstrates New QIF 2.0

Dimensional Metrology Standards Consortium (DMSC) President Curtis Brown of Honeywell FM&T, Lockheed Martin, NIST, John Deere, Capvidia, Metrosage, Origin International, IPI Solutions, Mitutoyo America Corporation, Innovalia Metrology, MTConnect Institute, InfinityQS, Kotem Ltd, Renishaw, and PAS Technology, demonstrates QIF version 2.0 as published in the September 5th, 2014 ANSI Standards Action publication.

The QIF V2.0 demonstration shows the metrology based workflow where all information for transporting quality data is derived from common libraries so that information modeling components can be reused throughout the entire quality measurement process and, as a result, the entire process is inherently interoperable.