Metrology Seminar/Open House

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Date/Time
Date(s) - 05/24/2018
9:30 am - 3:30 pm

Location
Mitutoyo M3 Center - Huntersville (Charlotte), NC

Category(ies)


Optical Measuring Systems, Sensors and Linear Encoders, and Surface Roughness

Thursday, May 24th, 2018
Charlotte NASCAR Race Weekend

Download the PDF for full details and registration information.

Experience the capabilities of Mitutoyo’s optical measuring systems and our innovative contact and non-contact sensors and linear encoder products.

Paul Nuara, optical sales specialist, will discuss optics and optical measuring from simple visual inspections systems to high-powered optical measuring microscopes.

Ed Galzin, sensor and encoder specialist, will discuss the different types of applications for linear encoders and contact sensors. Ed will discuss how to choose between absolute and incremental encoders, installation methods, as well as the importance of implementing our enhancing your current basic, semi-automatic and full automation based applications.

Fred Kline, form application engineer, will discuss the fundamentals of surface finish and understanding commonly used terminology.

Email Ernie Jarvis to register. Ernie.Jarvis@Mitutoyo.com

Event Registration

Event Registrations are closed for this event.

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