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Gage Calibration Systems and Methods
Overview: Download Course Description PDF
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This two-day course provides a comprehensive overview of the elements, design considerations, and operation of a modern Gage Calibration System. Day 1 presents the basic, common elements of an effective gage control and calibration system. Principle requirements of modern standards will be explored, including ISO10012:2003, ISO/TS16949:2002, and ISO/IEC17025:2005.
Day 2 presents the fundamental considerations and methods for proper calibration and care of common dimensional measuring and test equipment. Various calibration methods will be demonstrated and explained. The course will apply in-class activities to maximize the learning experience.<?xml:namespace prefix = o /><?xml:namespace prefix = o /><?xml:namespace prefix = o />
- Introduction
- Classifying dimensional calibration
- Units of measure, inch and SI metric systems
- Basis of calibration – basic concepts, 4:1 TUR
- History and current calibration system standards
- Calibration and Traceability
- Principle elements of a calibration system and Supplier Quality requirements
- Inventory and identification
- Intervals of calibration – setting initial and revising intervals
- Evaluation of calibration sources – accréditation versus complaisance
- Calibration standard pyramid, introduction to uncertainty
- Essential elements of traceability
- Temperature issues and control for calibration
- Standard temperature
- Temperature error sources
- Control and compensation – standard, gradient, and CTE
- Calibration Procedures – selection, source, internal developed, validation
- Introduction to Calibration Uncertainty
- Basic components
- Understanding the Uncertainty Budget process
- Sample budgets
- Best uncertainty versus Application uncertainty
- Presentation of calibration methods
- Gage blocks
- Surface plates
- Micrometers
- Calipers
- Indicators
- Cylindrical standards – ring gages, plug and pin gages
- Calibration of major measurement systems
- Other dimensional gages
Instructor:
Gordon Skattum is an ASQ Fellow, CCT and Senior Member of SME with over 36 years in quality engineering and manufacturing technology. He is a recognized expert in dimensional metrology, measurement systems analysis, and process control. As a member of the Technical Writing Group for the AIAG, he provided significant contributions to the automotive industry MSA Reference Manual, 3rd edition. Mitutoyo and its <?xml:namespace prefix = st1 /><?xml:namespace prefix = st1 /><?xml:namespace prefix = st1 />Institute of Metrology is a worldwide organization. We are proud to state that more than 200,000 engineers have attended our metrology seminars over the years. If you wish to register or if you have additional questions, please contact us at 630-723-3620, 888-MITUTOYO, or email mim@mitutoyo.com |
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